EMI Tester
- The EMI tester automatically measures the noise distribution of the electric field and the magnetic field radiated from electronic equipment with high accuracy.
- Even if PCB and IC parts have complicated bumpy shape and surface.The movable assembly can automatically trace them.
- EMI noise distribution is expressed as a variety of maps, such as 4D/3D/2D graphics and cross section view.
EMI Tester EMV-100,200
Left : EMV-100 Right: EMV-200
■ Automatic height adjustment mechanism
The electromagnetic near field antenna automatically goes along the surface of PCB and IC parts at point-blank range. (Gap can be set freely from 0 mm.) Measurement of strength distributions is synchronizing with the move.
■ View
Specification
Item | EMV-100 | EMV-200 | ||
Movable tabel | Movement range | X and Y axes | 170 mm | 300 mm |
Z axis | 100 mm | 230 mm | ||
θ axis | -100 to + 230° deg. | ± 360° deg. | ||
Alignment accuracy | X and Y axes | ±0.05 mm | ||
Z axis | ±0.05 mm | |||
θ axis | ±1° deg. | |||
Dimension (W×D×H) | 387 mm × 405 mm × 735 mm | 565 mm × 680 mm × 1003 mm | ||
Weight | 20 kg | 97 kg | ||
Overall control unit | Personal computer | Microsoft Windows 7 | ||
Software | Control Program EMVm1 | Control Program EMV3 | ||
Power Supply | AC Power Input | AC 100-230V, 50Hz / 60Hz | ||
Power Consumption | 0.5 kVA max | 1.0 kVA max | ||
Option | Measurement unit | Spectrum analyzer | ||
Antenna |
Electric field antenna W07E Magnetic field antenna W07 and so on. |
|||
Pre-amplifier |
AFS4-00010300-25-20P-6( 10MHz~3GHz, NF=2.5dB, GAIN=40dB ) AFS4-00100600-13-10P-4( 100MHz~6GHz, NF=2.5dB, GAIN=36dB ) and so on. |
|||
Shield box | The special shield box according to each tester-model can be prepared. |
■ Camera Option A measurement picture and measurement data are piled up and displayed. |
|
■ Datalink option for EMIStream(NEC) Overlapping real picture and EMI strength graph. |
|
■ Time-domain analysis (APD) Amplitude Probability Distribution or APD measurement doesn't require the device to be in such "connected" state but only in "operational" state to emit the EM noise. | |
■ Far-field EM field estimation by near-field EM measurement With the ability to measure and map the amplitude and phase of EM noise of specific frequency in a small-scale chambers, one is expected to estimate the results of far-field EMI normally measured in large anechoic chambers. |
|
■ Simultaneous Electric and Magnetic field
Using patented special probes that can make simultaneous electric and magnetic measurements, one can scan near-field EMI to measure electric and magnetic fields and map the magnitude of each property from a single scan. |