EMI Tester
- The EMI tester automatically measures the noise distribution of the electric field and the magnetic field radiated from electronic equipment with high accuracy.
- Even if PCB and IC parts have complicated bumpy shape and surface.The movable assembly can automatically trace them.
- EMI noise distribution is expressed as a variety of maps, such as 4D/3D/2D graphics and cross section view.
EMI Tester EMV-100,200

Left : EMV-100 Right: EMV-200

■ Automatic height adjustment mechanism
The electromagnetic near field antenna automatically goes along the surface of PCB and IC parts at point-blank range. (Gap can be set freely from 0 mm.) Measurement of strength distributions is synchronizing with the move.
■ View

Specification
| Item | EMV-100 | EMV-200 | ||
| Movable tabel | Movement range | X and Y axes | 170 mm | 300 mm |
| Z axis | 100 mm | 230 mm | ||
| θ axis | -100 to + 230° deg. | ± 360° deg. | ||
| Alignment accuracy | X and Y axes | ±0.05 mm | ||
| Z axis | ±0.05 mm | |||
| θ axis | ±1° deg. | |||
| Dimension (W×D×H) | 387 mm × 405 mm × 735 mm | 565 mm × 680 mm × 1003 mm | ||
| Weight | 20 kg | 97 kg | ||
| Overall control unit | Personal computer | Microsoft Windows 7 | ||
| Software | Control Program EMVm1 | Control Program EMV3 | ||
| Power Supply | AC Power Input | AC 100-230V, 50Hz / 60Hz | ||
| Power Consumption | 0.5 kVA max | 1.0 kVA max | ||
| Option | Measurement unit | Spectrum analyzer | ||
| Antenna |
Electric field antenna W07E Magnetic field antenna W07 and so on. |
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| Pre-amplifier |
AFS4-00010300-25-20P-6( 10MHz~3GHz, NF=2.5dB, GAIN=40dB ) AFS4-00100600-13-10P-4( 100MHz~6GHz, NF=2.5dB, GAIN=36dB ) and so on. |
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| Shield box | The special shield box according to each tester-model can be prepared. | |||
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■ Camera Option A measurement picture and measurement data are piled up and displayed. |
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■ Datalink option for EMIStream(NEC) Overlapping real picture and EMI strength graph. |
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| ■ Time-domain analysis (APD) Amplitude Probability Distribution or APD measurement doesn't require the device to be in such "connected" state but only in "operational" state to emit the EM noise. |
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■ Far-field EM field estimation by near-field EM measurement With the ability to measure and map the amplitude and phase of EM noise of specific frequency in a small-scale chambers, one is expected to estimate the results of far-field EMI normally measured in large anechoic chambers. |
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■ Simultaneous Electric and Magnetic field
Using patented special probes that can make simultaneous electric and magnetic measurements, one can scan near-field EMI to measure electric and magnetic fields and map the magnitude of each property from a single scan. |
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